Temperature detection from differences in off leak currents...

Details Temperature detection from differences in off leak currents... Temperature detection from differences in off leak currents...

2005-05-24

2005-05-24

Gutierrez, Diego (Department: 2859)

Thermal measuring and testing

Temperature measurement

By electrical or magnetic heat sensor

C327S512000

Reexamination Certificate

active

06896408

ABSTRACT:
A temperature detection circuit is provided inside a chip which is the same in which a CPU is provided, and includes a temperature detection part having a PMOS transistor and an NMOS transistor connected in series between a power supply potential VDD and a grounding potential. A stray capacitance between a junction (live node) between the PMOS transistor and the NMOS transistor, and the grounding potential, is charged with a current differential between the off leak current of the PMOS transistor and the off leak current of the NMOS transistor, thereby changing the potential of the live node. When the changed potential reaches a level of a threshold value in a given period of time, it is decided that the temperature of the CPU reaches a set temperature.

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