Temperature detecting apparatus

Oscillators – With device responsive to external physical condition – Temperature or light responsive

Reexamination Certificate

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Details

C331S056000, C374S170000, C377S025000, C702S130000

Reexamination Certificate

active

07573340

ABSTRACT:
There is provided a temperature detecting apparatus for improving operational characteristics, which vary according to the temperature, of elements in a semiconductor memory device. The temperature detecting apparatus of the present invention includes: a first oscillator that outputs a first oscillating signal in response to a first oscillator reset signal, the first oscillating signal being independent of the temperature; a second oscillator that outputs a second oscillating signal in response to a second oscillator enable signal, the second oscillating signal being dependent on the temperature; a comparator that compares an output pulse of the first oscillator with an output pulse of the second oscillator and then outputs a temperature detection comparison signal; and an output unit that outputs a temperature detection signal in response to an input of the temperature detection comparison signals.

REFERENCES:
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patent: 5680359 (1997-10-01), Jeong
patent: 5899570 (1999-05-01), Darmawaskita et al.
patent: 6160755 (2000-12-01), Norman et al.
patent: 6695475 (2004-02-01), Yin
patent: 6893154 (2005-05-01), Gold et al.
patent: 2007/0069875 (2007-03-01), Doi
patent: 03231517 (1991-10-01), None
patent: 04236517 (1992-08-01), None
patent: 6318821 (1994-11-01), None

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