Thermal measuring and testing – Thermal testing of a nonthermal quantity – Of susceptibility to thermally induced deteriouration – flaw,...
Patent
1991-05-20
1992-09-15
Yasich, Daniel M.
Thermal measuring and testing
Thermal testing of a nonthermal quantity
Of susceptibility to thermally induced deteriouration, flaw,...
738656, G01M 1900, G01N 2572
Patent
active
051471361
ABSTRACT:
Two environmental test zones at different temperatures are separated by an insulated wall. A portion of the wall is rotatable and is designed to hold a test specimen thereon. By rotating this portion of the insulated wall, the specimen is exposed to different temperature zones in recurrent cycles. The two temperature zones are readily separable for ease in removing and installing test specimens.
REFERENCES:
patent: 3488681 (1970-01-01), Mita et al.
patent: 3680356 (1972-08-01), Felton, Jr.
patent: 3807216 (1974-04-01), Lindwedel et al.
patent: 4324285 (1982-04-01), Henderson
patent: 4575257 (1986-03-01), Oqura et al.
patent: 4729246 (1988-03-01), Melgaard et al.
patent: 4787752 (1988-11-01), Fraser et al.
patent: 4807247 (1989-02-01), Robbins, III
patent: 4854726 (1989-08-01), Lesley et al.
patent: 4925089 (1990-05-01), Chaparro et al.
Hartley Jeffrey W.
Zelner Burch E.
Crane Plastics Company
Gray John L.
Yasich Daniel M.
LandOfFree
Temperature cycling test chambers does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Temperature cycling test chambers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Temperature cycling test chambers will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-731974