Thermal measuring and testing – Differential thermal analysis
Reexamination Certificate
2006-05-16
2006-05-16
Verbitsky, Gail (Department: 2859)
Thermal measuring and testing
Differential thermal analysis
C374S016000, C374S043000
Reexamination Certificate
active
07044635
ABSTRACT:
Disclosed is a temperature correction method for a thermal analysis apparatus which measures electric current, voltage, and electric resistance of a measurement sample while changing the temperature of the measurement sample set between a pair of electrodes. The paired electrodes are connected by a reference substance, and a weight is set on the reference substance. The temperature at the time when the reference substance is fused and the weight falls cutting the reference substance is measured actually as melting point by a temperature sensor. Based on a difference between the actually measured value and a literature value of the melting point of the reference substance, the temperature measured by the temperature sensor is corrected. It is thus possible to correct precisely the results measured by the thermal analysis apparatus which deals with electric current, voltage, electric resistance, dielectric constant, electric capacity, thermal electromotive force, thermally stimulated current, and the like, as targets to be measured.
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Geoffrey A. Bonvalet, “Differential Scanning Calorimetric Study of the Nematic Liquid Crystal 5CB”, Physics Department, The College of Wooster, May 6, 1999.
Buchanan & Ingersoll PC
Rigaku Corporation
Verbitsky Gail
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