Temperature control for device under test

Details Temperature control for device under test Temperature control for device under test

1985-04-30

1988-03-29

Gruber, Felix D.

Boots, shoes, and leggings

324 73PC, 364174, 374 57, 374135, G01K 1700

Patent

active

047348720

ABSTRACT:
A system for and method of precisely controlling the temperature of an electronic component through a range of temperatures by controlling the temperature of a gas forced into contact with the component is disclosed. The system comprises a dual control loop including two sensors, one for measuring the temperature of the gas and the other for sensing the temperature of the component, for controlling the temperature of the gas so as to provide accurate control of the temperature of the component.

REFERENCES:
patent: 3691840 (1972-09-01), Datour et al.
patent: 3979671 (1976-09-01), Meeker et al.
patent: 4102150 (1978-07-01), Kountz
patent: 4112589 (1978-09-01), Palfrey et al.
patent: 4286391 (1981-09-01), Gerry
patent: 4397101 (1983-08-01), Richard
patent: 4426619 (1984-01-01), Demand
patent: 4437771 (1984-03-01), Cazzaniga
patent: 4604572 (1986-08-01), Hariuchi et al.
Wills: Cascade Control: When, Why and How Automatic Control, Sep. 1961, pp. 36-39.
Robert J. Bibbero, "Microprocessor in Instruments and in Control," John Wiley & Sons, New York, 1977, pp. 155-175.
Katshuhiko Ogata, "Modern Control Engineering," Prentice-Hall, Inc., Englewood Cliffs, N.J., 1970, pp. 151-159.

Affiliated with

Also associated with

Rating

Temperature control for device under test does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Temperature control for device under test, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Temperature control for device under test will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1093407