Temperature compensation system of light measuring circuit

Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means

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354428, 354459, 354464, 250214P, 250214C, 250214L, 307297, 307491, 323907, G03B 7083, G05F 308

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active

044797087

ABSTRACT:
Disclosed is a temperature compensation system for light measuring circuits. Said system compensates for the change, over temperature, of the output of the light measuring circuit by applying a bias source with a predetermined temperature coefficient. The system is designed so the bias voltage source is derived from the V.sub.BE (base to emitter voltage) difference between a pair of transistors, which difference is generated by the difference of current density at the junction of the pair of transistors obtained by flowing a pair of currents with a constant ratio independent of temperature.

REFERENCES:
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patent: 4063120 (1977-12-01), Idei
patent: 4072962 (1978-02-01), Maida
patent: 4100436 (1978-07-01), Van de Plassche
patent: 4176308 (1979-11-01), Dobkin et al.
patent: 4303318 (1981-12-01), Kitaura et al.
patent: 4375321 (1983-03-01), Suzuki et al.
IBM Technical Disclosure Bulletin, "Temperature Compensated Voltage Reference Source", by Chung C. Liu, vol. 14, No. 4, Sep. 1971.

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