Temperature compensation for pressure gauges

Measuring and testing – Fluid pressure gauge – With pressure and/or temperature compensation

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

364558, 364571, 364578, G01L 1904

Patent

active

046075305

ABSTRACT:
Methods and apparatus are provided for thermally compensating pressure determinations of pressure gauges through the use of a fast responding thermal device which is attached to the gauge and a dynamic model of the pressure gauge resonator which assumes that the temperature is not uniform throughout the resonator when temperature transients are present. The pressure gauge is subjected to known temperature and pressure conditions so that the parameters of a dynamic thermal model of the resonator may be determined, as well as a frequency and temperature to pressure mapping. The gauge may then be used to make measurements and provides a frequency output. The thermal device provides temperature readings. The temperature readings are input into a dynamic system using the dynamic thermal model to provide a correction to the frequency output of the pressure gauge such that the corrected frequency may be input into the frequency and temperature to pressure mapping to provide the thermally corrected pressure reading. Different embodiments of the invention include a single gauge in an open-loop configuration, two gauges in an open-loop configuration which is especially useful in the borehole environment, a single gauge in a closed-loop configuration, and two gauges in a dynamic system switching configuration.

REFERENCES:
patent: 3561832 (1969-04-01), Karrer et al.
patent: 3646815 (1972-03-01), Martin et al.
patent: 4000643 (1977-01-01), Pearson
patent: 4192005 (1980-03-01), Kurtz
patent: 4208918 (1980-10-01), Miyamae
patent: 4226125 (1980-04-01), Waugh
patent: 4320664 (1982-06-01), Rehn et al.
patent: 4355537 (1982-04-01), Vander Have
patent: 4366714 (1983-09-01), Adorni
patent: 4414853 (1983-12-01), Bryzek
patent: 4464725 (1984-08-01), Briefer
patent: 4468968 (1984-07-01), Kee
patent: 4490803 (1984-12-01), Briggs
Sinha & Tiersten, "Transient Thermally Induced Frequency Excursions in Doubly-Rotated Quartz Thickness-Mode Resonators", Proc. 34th Ann. Frequency Control Symposium, May 1980, pp. 393-402.
Ballato & Vig, "Static and Dynamic Frequency-Temperature Behavior of Singly and Doubly Rotated, Oven-Controlled Quartz Resonators"; Proc. 32nd Ann. Symposium on Frequency Control, 1978, pp. 180-188.
Athans, Michael, "The Role and Use of the Stochastic Linear-Quadratic-Gaussian Problem in Control System Design"; IEEE Transactions on Automatic Control, vol. AC-16, No. 6, Dec. 1971, pp. 529-552.
"The Linear Quartz Thermometer--a New Tool for Measuring Absolute and Difference Temperatures", Hewlett Packard Journal, vol. 16, No. 7, Mar. 1965, pp. 1-7.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Temperature compensation for pressure gauges does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Temperature compensation for pressure gauges, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Temperature compensation for pressure gauges will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2306295

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.