Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1992-11-06
1994-11-08
Raevis, Robert
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
G01B 530
Patent
active
053616375
ABSTRACT:
Temperature compensation circuitry employing a single temperature compensation element is disclosed. By use of a single temperature compensation element, the effects of temperature on both zero offset and signal gain of a sensor may be adjusted. In addition, the circuit provides the unique capability of employing a single temperature compensation element while permitting for the independent adjustment of compensation of zero offset and signal gain.
REFERENCES:
patent: 4464932 (1984-08-01), Ewing et al.
patent: 5048343 (1991-09-01), Oboodi et al.
Judd Daniel R.
McLoughlin Robert F.
MKS Instruments Inc.
Raevis Robert
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