Oscillators – With frequency calibration or testing
Patent
1990-11-05
1991-08-20
Grimm, Siegfried H.
Oscillators
With frequency calibration or testing
331158, 331176, H03B 532, H03L 102
Patent
active
050417991
ABSTRACT:
A crystal reference frequency is characterized by determining the compensation signal variations of a compensation signal over temperature for corresponding signal characterization words. The frequency shift variations of the crystal over temperature are determined and the temperature at which the inflection point of the crystal occurs is found. An inflection point characterization word is found which matches the temperature at which the inflection point of the crystal occurs to the temperature at which the inflection point of the compensation signal occurs. The frequency variations of the crystal are correlated to the compensation signal variations and a signal characterization word is selected which substantially minimizes the frequency variations of the crystal over temperature.
REFERENCES:
patent: 3970818 (1976-07-01), Friedrichs
patent: 3978650 (1976-09-01), Hashimoto et al.
patent: 4004133 (1977-01-01), Hannan et al.
patent: 4430596 (1984-02-01), Shanley
patent: 4746879 (1988-05-01), Ma et al.
patent: 4949055 (1990-08-01), Leitl
Babayi Robert S.
Grimm Siegfried H.
Motorola Inc.
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