Temperature compensation circuit and testing apparatus

Details Temperature compensation circuit and testing apparatus Temperature compensation circuit and testing apparatus

2006-01-31

2008-03-11

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C714S738000, C327S378000

Reexamination Certificate

active

07342407

ABSTRACT:
A temperature compensation circuit for effectively compensating the difference of a switching timing due to temperature change of a switching element included in a logic circuit is provided. The temperature compensation circuit includes a temperature detecting section for detecting a value corresponding to the temperature of the switching element, and a correction section for correcting the voltage of a logic signal inputted from a previous circuit to the logic circuit in order to reduce the difference of the switching timing due to the temperature change of the switching element based on the value corresponding to the temperature.

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International Search Report issued in International Application No. PCT/JP2007/050156 mailed on Apr. 10, 2007 and partial English translation thereof, 8 pages.

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