Temperature compensation apparatus for logic gates

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons

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357 92, 357 28, 307491, 307542, 307278, H01L 2702, H01L 2358, G06G 710, H03B 104

Patent

active

051444054

ABSTRACT:
A temperature compensation circuit enables the reliable operation of semiconductor logic gates over wide temperature ranges. The temperature compensation circuit includes a thin film resistor in series with an implanted resistor, both located on the same semiconductor substrate and both having one terminal connected together. The other terminal of one of the resistors is coupled to a point of reference potential, while the other terminal of the other resistor is coupled to an operating potential. A voltage is provided at the junction between the two resistors, which voltage is coupled to the logic gates. The voltage serves as a pull-down source and tracks over the wide temperature range to enable the logic gate to reliably operate with an adequate noise margin over temperature ranges between -55.degree. C. to +125.degree. C.

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