Temperature compensation apparatus

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons

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307310, 307591, 330289, 358166, G01K 724, H03K 1714

Patent

active

047498897

ABSTRACT:
A so-called "V.sub.BE multiplier" circuit is used to temperature compensate a semiconductor device with respect to both short term self-heating effects and long term ambient temperature effects. The compensation circuit includes a transistor with a base, an emitter coupled to an operating potential, and a collector coupled to an operating potential. First and second resistors are respectively coupled across the base-emitter and collector-base junctions of the transistor. The values of the resistors as chosen so that a voltage derived from the collector-emitter path of the transistor and applied to the semiconductor device exhibits a temperature coefficient which substantially matches the temperature coefficient of the semiconductor device.

REFERENCES:
patent: 3555309 (1971-01-01), Limberg
patent: 3557383 (1971-01-01), Wavre et al.
patent: 3973147 (1976-08-01), Yu
patent: 4207538 (1980-06-01), Goel
patent: 4260956 (1981-04-01), Harford
patent: 4494145 (1985-01-01), Kokufukata et al.
patent: 4652144 (1987-03-01), Gunther et al.
Figure 255, pp. 178-180 of Power Transistor Applications Manual, Solid State Division, RCA Corporation.

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