Temperature compensated TTL to ECL translator

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons

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307446, 307455, 307297, 323313, H03K 19092, H03K 19086, H03K 19003

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active

045338426

ABSTRACT:
A temperature compensated differential level shift circuit is provided. An ECL type buffered differential circuit employs a source of threshold voltage, V.sub.T, which matches the temperature-dependent characteristic of the input section of the level shift circuit. In a preferred embodiment, a Schottky diode is provided in the output section of a bandgap reference voltage generator which matches the temperature dependence of a Schottky diode in the input section of the level shift circuit. As temperature shifts, the threshold voltage will shift in a manner that tracks the temperature-produced shift in the input voltage as it passes through the Schottky diode in the input section of the level shift circuit. Matched PNP or NPN transistors may also be used in the input section of the level shift circuit and in the output section of the bandgap reference voltage generator.

REFERENCES:
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patent: 3742250 (1973-06-01), Kan
patent: 3787734 (1974-01-01), Dorler et al.
patent: 3959666 (1976-05-01), Fett et al.
patent: 3970876 (1976-07-01), Allen et al.
patent: 3974402 (1976-08-01), Fett et al.
patent: 3986045 (1976-10-01), Lutz
patent: 4079308 (1978-03-01), Brown
patent: 4272811 (1981-06-01), Wong
patent: 4393315 (1983-07-01), Stickel et al.
Taylor et al, "Logic Signal Level Shift Circuit"; IBM Tech. Disclosure Bull., vol. 12, No. 2, p. 296; 7/1969.
Bond, "TTL-To-ECL Logic Level Converter"; IBM Tech Discl. Bull., vol. 20, No. 10, p. 3976; 3/1978.
Blumberg et al., "Receiver Translator Circuit"; IBM Tech. Discl. Bull., vol. 24, No. 12, pp. 6467-6468; 5/1982.
Seidman, Integrated Circuits Applications Handbook, 1983, pp. 498-499.

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