Data processing: measuring – calibrating – or testing – Calibration or correction system – Temperature
Reexamination Certificate
2006-10-10
2006-10-10
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Temperature
Reexamination Certificate
active
07120549
ABSTRACT:
A temperature-compensated self-refresh circuit (TCSR) for use in a semiconductor memory device includes a temperature sensor, which is controlled by a temperature sensor control signal, for outputting a temperature voltage based on a temperature; a voltage comparison unit for comparing a reference voltage with the temperature voltage; a delay unit for delaying a signal outputted from the voltage comparison unit; a control unit for generating the temperature sensor control signal in response to a temperature limit signal and a temperature sensor enable signal and a temperature-compensated refresh cycle signal in response to a delayed signal from the delay unit; and a temperature sensor limiter, which is reset by the refresh cycle signal, for generating the temperature sensor limit signal based on a refresh basic cycle signal and the temperature-compensated refresh cycle signal when the temperature sensor is not used.
REFERENCES:
patent: 2005/0125597 (2005-06-01), Lovett
patent: 2005/0228611 (2005-10-01), Kim
patent: 100123827 (1997-09-01), None
Barlow John
Hynix / Semiconductor Inc.
Mayer, Brown, Rowe and Maw LLP
Pretlow Demetrius
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