Temperature-compensated magnetic field measuring instrument

Details Temperature-compensated magnetic field measuring instrument Temperature-compensated magnetic field measuring instrument

1983-02-01

1986-08-05

Karlsen, Ernest F.

Electricity: measuring and testing

Magnetic

Magnetometers

350378, G01R 3302, G02B 530, G02F 109

Patent

active

046045775

ABSTRACT:
A measuring instrument of magnetic field utilizing Faraday rotation is disclosed in which a medium exhibiting Faraday rotation includes at least one thin magnetic garnet film magnetized in a propagation direction of light and having a composition expressed by a general formula R.sub.3-x Q.sub.x (Fe.sub.5-y M.sub.y)O.sub.12 (where R indicates at least one element selected from a group consisting of Y, La, Lu, Ca, Sm and Bi, Q indicates at least one element selected from a group consisting of Gd, Eu, Er, Tm, Tb, Yb, Ho and Dy, M is at least one element selected from a group consisting of Ga, Al, Ge, Si, Sc, Mn, In, V and Cr, the value of x lies in a range expressed by a formula 0.1.ltoreq.x.ltoreq.3.0, and the value of y lies in a range expressed by a formula 0.ltoreq.y.ltoreq.5.0). According to this instrument, stable measured values are obtained independently of temperature variation.

REFERENCES:
patent: 3621390 (1971-11-01), Willisen
patent: 3707321 (1972-12-01), Jaecklin et al.
patent: 4112367 (1978-09-01), Hepner et al.

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