Temperature compensated bit-line precharge

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

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Details

C365S185250, C365S203000, C365S211000

Reexamination Certificate

active

10884152

ABSTRACT:
A nonvolatile semiconductor memory device compensates for temperature changes by holding constant a bit line precharge level. A memory device according to the present invention may include an electrically programmable memory cell array connected to a plurality of word lines and a plurality of bit lines, a bit line voltage supplying circuit for supplying a bit line voltage to the bit lines, a shut-off circuit connecting the memory cell array and the bit line voltage supplying circuit, and a shut-off controlling circuit for controlling the shut off circuit. The shut-off controlling circuit may be constructed to compensate for temperature changes in order to hold the bit-line precharge level constant.

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patent: 6674668 (2004-01-01), Ikehashi et al.
patent: 6678191 (2004-01-01), Lee et al.
patent: 6898108 (2005-05-01), Kato et al.

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