Temperature and voltage controlled integrated circuit processes

Details Temperature and voltage controlled integrated circuit processes Temperature and voltage controlled integrated circuit processes

2004-06-30

2008-03-18

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07345495

ABSTRACT:
The present application relates to apparatus and methods for burn-in and other diagnostics performed on integrated circuits. In one embodiment, the invention includes a plurality of sockets, each to hold an integrated circuit (IC), and coupling power to the respective IC from a remote power supply, a plurality of voltage detectors, each coupled to a socket to sense the voltage of the power coupled to the respective IC, and a plurality of remote voltage regulators, each coupled between the power supply and a respective socket, to receive the sensed voltage from the respective voltage detector and to adjust the voltage of the respective coupled power in accordance therewith.

REFERENCES:
patent: 4926117 (1990-05-01), Nevill
patent: 5093982 (1992-03-01), Gussman
patent: 5600257 (1997-02-01), Leas et al.
patent: 6119255 (2000-09-01), Akram
patent: 6181146 (2001-01-01), Koyama

Affiliated with

Also associated with

Rating

Temperature and voltage controlled integrated circuit processes does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Temperature and voltage controlled integrated circuit processes, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Temperature and voltage controlled integrated circuit processes will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3979323