Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-11-14
2006-11-14
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C165S080300, C165S080400, C324S1540PB, C361S696000
Reexamination Certificate
active
07135877
ABSTRACT:
An innovative chip testing system and method includes controlling temperature and condensation during testing. Coarse temperature is controlled by providing a desired fluid flow rate and fluid temperature to a cold plate. Fine temperature control is provided by a feedback loop which controls the power dissipation of cartridge heaters installed within the cold plate. Condensation control is provided by insulating various components of the system, manipulation of dry compressed air in enclosures to reduce surface dew point temperatures, usage of cartridge heaters in a card backside stiffener plate, and by providing a heatsink assembly which prevents condensation on the insulation.
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Beaman Daniel Paul
Corbin, Jr. John Saunders
Kent Dales Morrison
Mahaney, Jr. Howard Victor
Phan Hoa Thanh
Chan Emily Y
Manzo Peter B.
Nguyen Vinh
Tyson Thomas E.
Yee Duke W.
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