Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2007-05-22
2007-05-22
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
Reexamination Certificate
active
10877914
ABSTRACT:
Briefly, one or more memory access parameters used to access a memory cell are adjusted based on a sensed operating temperature. In one embodiment, a pulse width of an access voltage is increased as the operating temperature decreases below a threshold. In another embodiment, a drive voltage is decreased as the operating temperature increases.
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Coulson Richard L.
Lueker Jonathan C.
Barlow John
Intel Corporation
Sun Xiuqin
Wheeler Cyndi M.
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