Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent
1989-07-11
1991-09-10
Evans, F. L.
Optics: measuring and testing
Inspection of flaws or impurities
Bore inspection
359435, G01N 2188
Patent
active
050468456
ABSTRACT:
A technoscope for checking for damage, especially a crack, in a surface of a cavity in a technical component, is arranged not only to establish the area of damage but also to measure the depth of a damaged area. To this end, the technoscope has a measuring attachment comprising a measuring probe with two electrodes for straddling the damaged area, and being supported in the cavity by a support element. The depth of the damaged area is measured by means of a depth measuring instrument sensitive to the disturbance of current flow between the electrodes, and the potential difference resulting therefrom.
REFERENCES:
patent: 2587476 (1952-02-01), Huhn
patent: 4267828 (1981-05-01), Matsuo
patent: 4403273 (1983-09-01), Nishioka
patent: 4702229 (1987-10-01), Zobel
Evans F. L.
Koren Matthew W.
Richard Wolf GmbH
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