Technoscope

Details Technoscope Technoscope

2006-08-01

2006-08-01

Nguyen, Tu T. (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

Bore inspection

Reexamination Certificate

active

07084971

ABSTRACT:
A technoscope for examining surfaces in confined spaces includes a shank on whose distal end a pivotable arm with a measuring device is arranged, which may be pivoted from a first position in which the arm extends in the longitudinal direction of the shank into a second position in which the arm extends bent at an angle to the longitudinal axis of the shank.

REFERENCES:
patent: 3823482 (1974-07-01), Schiler
patent: 4078864 (1978-03-01), Howell
patent: 5335061 (1994-08-01), Yamamoto et al.
patent: 5349940 (1994-09-01), Takahashi et al.
patent: 5475485 (1995-12-01), Diener
patent: 5565981 (1996-10-01), Winstead et al.
patent: 5656011 (1997-08-01), Uihlein et al.
patent: 5803680 (1998-09-01), Diener
patent: 6009189 (1999-12-01), Schaack
patent: 6152870 (2000-11-01), Diener
patent: 6532840 (2003-03-01), Hatley et al.
patent: 2003/0032863 (2003-02-01), Kazakevich
patent: 34 05 514 (1985-08-01), None
patent: 44 32 677 (1996-03-01), None
patent: 44 34 863 (1996-04-01), None
patent: 195 24 770 (1997-01-01), None
patent: 195 37 812 (1997-01-01), None
patent: 197 27 419 (1999-02-01), None
patent: 63-193121 (1988-08-01), None
Office Action dated Mar. 25, 2004 for the corresponding German Application No. 103 17 488.5.

Affiliated with

Also associated with

Rating

Technoscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Technoscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Technoscope will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3623405