Techniques of programming and erasing an array of multi-state fl

Static information storage and retrieval – Floating gate – Multiple values

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

36518511, 36518519, 36518522, G11C 700

Patent

active

059093900

ABSTRACT:
A memory system made up of electrically programmable read only memory (EPROM) or flash electrically erasable and programmable read only memory (EEPROM) cells. An intelligent programming technique allows each memory cell to store more than the usual one bit of information. More than one bit is stored in a cell by establishing more than two distinct threshold states into which the cell is programmed. A series of pulses of increasing voltage is applied to each addressed memory cell during its programming, the state of the cell being read in between pulses. The pulses are terminated upon the addressed cell reaching its desired state or a preset maximum number of pulses has been reached. An intelligent erase algorithm prolongs the useful life of the memory cells. A series of pulses is also applied to a block of cells being erased, the state of at least a sample number of cells being read in between pulses. The erasing process is stopped when the cells being read are determined to have reached a fully erased state or one of a number of other conditions has occurred. Individual records of the number of erase cycles experienced by blocks of flash EEPROM cells are kept, preferable as part of the blocks themselves, in order to maintain an endurance history of the cells within the blocks. Use of these various features provides a memory having a very high storage density and a long life, making it particularly useful as a solid state memory in place of magnetic disk storage devices in computer systems.

REFERENCES:
patent: 4004159 (1977-01-01), Rai et al.
patent: 4051354 (1977-09-01), Choate
patent: 4087795 (1978-05-01), Rossler
patent: 4093985 (1978-06-01), Das
patent: 4181980 (1980-01-01), McCoy
patent: 4272830 (1981-06-01), Moench
patent: 4279024 (1981-07-01), Schrenk
patent: 4281398 (1981-07-01), McKenny et al.
patent: 4287570 (1981-09-01), Stark
patent: 4357685 (1982-11-01), Daniele et al.
patent: 4422161 (1983-12-01), Kressel et al.
patent: 4448400 (1984-05-01), Harari
patent: 4460982 (1984-07-01), Gee et al.
patent: 4493075 (1985-01-01), Anderson et al.
patent: 4503518 (1985-03-01), Iwahashi
patent: 4525839 (1985-07-01), Nozawa et al.
patent: 4527251 (1985-07-01), Nibby, Jr. et al.
patent: 4586163 (1986-04-01), Koike
patent: 4617651 (1986-10-01), Ip et al.
patent: 4652897 (1987-03-01), Okuyama et al.
patent: 4653023 (1987-03-01), Suzuki et al.
patent: 4667217 (1987-05-01), Janning
patent: 4718041 (1988-01-01), Baglee et al.
patent: 4733394 (1988-03-01), Giebel
patent: 4763305 (1988-08-01), Kuo
patent: 4800520 (1989-01-01), Iijima
patent: 4847808 (1989-07-01), Kobatake
patent: 4887234 (1989-12-01), Iijima
patent: 4942556 (1990-07-01), Sasaki et al.
patent: 4949240 (1990-08-01), Iijima
patent: 5016215 (1991-05-01), Tigelaar
patent: 5043940 (1991-08-01), Harari
patent: 5053990 (1991-10-01), Kreifels et al.
patent: 5218569 (1993-06-01), Banks
patent: 5268870 (1993-12-01), Harari
patent: 5270979 (1993-12-01), Harari et al.
patent: 5293560 (1994-03-01), Harari
patent: 5369615 (1994-11-01), Harari et al.
patent: 5394362 (1995-02-01), Banks
patent: 5396468 (1995-03-01), Harari et al.
patent: 5414664 (1995-05-01), Lin et al.
patent: 5434825 (1995-07-01), Harari
patent: 5535328 (1996-07-01), Harari et al.
patent: 5568439 (1996-10-01), Harari
patent: 5583812 (1996-12-01), Harari
patent: 5642312 (1997-06-01), Harari
"Japanese Develop Nondestructive Analog Semiconductor Memory," Electronics Review, Jul. 11,1974, p. 29.
Krick, "Three-State NMOS FET Memory Array," IBM Technical Disclosure Bulletin, vol. 18, No. 12, May 1976, p. 4192.
Alberts et al., "Multi-Bit Storage FET EAROM Cell," IBM Technical Disclosure Bulletin, vol. 24, No. 7A, Dec. 1981, p. 3311.
Bleiker et al., "A Four-State EEPROM Using Floating-Gate Memory Cells," IEEE Journal of Solid-State Circuits, Jul. 1987, p. 260.
Horiguchi et al., "An Experimental Large-Capacity Semiconductor File Memory Using 16-Levels/Cell Storage," IEEE Journal of Solid-State Circuits, Feb. 1988, p. 27.
Furuyama et al., "An Experimental 2-Bit/Cell Storage DRAM for Macrocell or Memory-on-Logic Applications," IEEE Custom Integrated Circuits Conference, May 1988, p. 4.4.1.
Harold, "Production E.P.R.O.M. Loading," New Electronics, vol. 15, No. 3, Feb. 1982, pp. 47-50.
Torelli et al., "An Improved Method for Programming a Word-Erasable EEPROM," Alta Frequenza, vol. 52, No. 5, Nov. 1983, pp. 487-494.
M. Stark, "Two Bits Per Cell ROM," Digest of Papers VLSI, 1981, pp. 209-212.
Torelli et al., "An Improved Method For Programming A Word-Erasable EEPROM," Alta Frequenza, vol. 52, n.6, Nov.-Dec., 1983.
Seeq Technology, Inc., Advance Data Sheet, 48C512/48C1024 512K/1024K Flash EEPROM, pp. 1-91 to 1-101 (Jul. 1987).
Lucerno et al., "A 16kbit Smart 5 V-Only EEPROM with Redundancy," IEEE Journal of Solid-State Circuits, vol. SC-18, No. 5, pp. 539-544 (Oct. 1983).
Berenga et al., "E.sup.2 -PROM TV Synthesizer," 1978 IEEE ISSCC Digest of Technical Papers, Sec 039463, pp. 196-197 (Feb., 1978).
Gee et al., "An Enhanced 16K E.sup.2 PROM," IEEE Journal of Solid-State Circuits, vol.SC-17, No. 5, pp. 828-832 (Oct., 1982).
Torelli, "An LSI Technology Fully Compatible EAROM Cell," Alta Frequenza, No. 6, vol. LI, pp. 345-351 (1982).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Techniques of programming and erasing an array of multi-state fl does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Techniques of programming and erasing an array of multi-state fl, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Techniques of programming and erasing an array of multi-state fl will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-959445

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.