Techniques for non-invasive RF circuit testing and RF signal flo

Details Techniques for non-invasive RF circuit testing and RF signal flo Techniques for non-invasive RF circuit testing and RF signal flo

1996-08-01

1998-10-13

Brock, Michael

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

324754, 324534, G01R 3128

Patent

active

058217584

ABSTRACT:
Methods and systems for non-invasive RF circuit testing, and/or for RF signal redirection, are disclosed. These methods and systems are used in conjunction with an RF circuit having a first circuit element, a second circuit element, a microstrip line coupling the first circuit element to the second circuit element, such that RF power flows along the microstrip line from the first circuit element to the second circuit element, and an RF test port for testing the RF circuit. A first removable electrical impedance is placed in physical proximity to the microstrip line to produce a first impedance mismatch at the microstrip line, such that some RF power is reflected by the mismatch back to the first circuit element. A second removable electrical impedance is placed in physical proximity to the microstrip line, such that the microstrip line is coupled to the RF test port.

REFERENCES:
patent: 4565966 (1986-01-01), Burr et al.
patent: 5420500 (1995-05-01), Kerschner
patent: 5488313 (1996-01-01), Gourse et al.

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