Techniques for developing integrated circuit test programs and t

Details Techniques for developing integrated circuit test programs and t Techniques for developing integrated circuit test programs and t

1990-08-01

1995-08-29

Beausoliel, Jr., Robert W.

Excavating

371 251, G06F 1100

Patent

active

054467420

ABSTRACT:
A computer process for developing a test program and data for use on automatic test equipment ("ATE") to test the logical function of actual integrated circuits. The separate trace files usually developed by the designer of a particular circuit in order to simulate the circuit's logical operation are utilized to produce the test program and data for controlling the ATE's testing of that circuit. The computer implemented process for doing so includes separate preliminary processing, related to the trace files but essentially unrelated to the particular ATE used, and post processing, for converting the intermediate results of the preliminary processing into a test program and data for driving a particular type of ATE. The process includes the use of common timing files for data from the plurality of trace files, and conversion of a binary integer representation of timing edges to ASCII characters with a significantly reduced number of bits.

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