Techniques for analyzing data generated by instruments

Details Techniques for analyzing data generated by instruments Techniques for analyzing data generated by instruments

2007-06-12

2007-06-12

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Measured signal processing

C702S182000

Reexamination Certificate

active

11118683

ABSTRACT:
According to one embodiment of the invention, a method for analyzing data from an instrument is disclosed. The raw data generated by the instrument, along with configuration data generated by a user, is packaged into a calling model. The raw data may include, for example, counts having a certain kinetic energy when analyzing photoelectron spectroscopy data. The configuration data may include several parameters selected by the user based on the composition and configuration of the structure being measured. The calling model may serve as an interface between the instrument and an engine for generating an algorithm for returning desired results to the user. The engine then generates the algorithm as well as the results specified by the user, and the calling model returns the results to the user. This allows a specific algorithm and results for a specific measured sample or structure to be generated using known algorithms and functions.

REFERENCES:
patent: 4492740 (1985-01-01), Yamamoto et al.
patent: 5995916 (1999-11-01), Nixon et al.
patent: 6326617 (2001-12-01), Tomie et al.
patent: 2005/0092920 (2005-05-01), Lee et al.

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