Technique to remove sensing artifacts from a linear array...

Details Technique to remove sensing artifacts from a linear array... Technique to remove sensing artifacts from a linear array...

2007-11-14

2009-06-16

Luu, Thanh X (Department: 2878)

Radiant energy

Photocells; circuits and apparatus

With circuit for evaluating a web, strand, strip, or sheet

C347S019000

Reexamination Certificate

active

07547903

ABSTRACT:
Disclosed is a method and system for calibrating an image capturing sensor. The method and system include generating a test pattern on an image receiving device and measuring one or more colorimetric properties of the test pattern with an image sensor. The disclosed method and system measure the test pattern with the image sensor located in two or more different cross-process positions to determine an independent uniformity profile for the image sensor and the image rendering process.

REFERENCES:
patent: 7154110 (2006-12-01), Mizes et al.
patent: 2006/0071185 (2006-04-01), Mizes et al.
patent: 2007/0252861 (2007-11-01), Wu et al.
U.S. Appl. No. 11/410,798, filed Apr. 25, 2006, Klassen et al.

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