Boots – shoes – and leggings
Patent
1985-09-03
1987-11-10
Gruber, Felix D.
Boots, shoes, and leggings
364579, 371 16, 371 18, G06F 1130, G05B 2302
Patent
active
047062088
ABSTRACT:
The present invention relates to an Operational Life Test (OLT) or "burn-in" technique for testing microprocessors. In accordance with the present invention, an OLT chamber is provided wherein many Evaluation Boards are mounted within racks in a frame in the chamber, each Board being designed for separately exercising its associated microprocessor integrated circuit (IC). During the OLT or burn-in procedure, each Evaluation Boards runs its own internally stored diagnostics, simultaneously with other Boards, to exercise the associated microprocessor ICs while the power to the Boards and the environment within the chamber is appropriately cycled to simulate system testing, installation or normal customer use. During the OLT procedure, each Board periodically reports the status of the associated microprocessor IC to circuitry such as a computer outside the chamber in order to provide a means for determining and recording any failure of a Board.
REFERENCES:
patent: 3969618 (1976-07-01), Strubel et al.
patent: 4125763 (1978-11-01), Drabing et al.
patent: 4371952 (1983-02-01), Schuck
patent: 4402055 (1983-08-01), Lloyd et al.
patent: 4495622 (1985-01-01), Charruau
patent: 4581738 (1986-04-01), Miller et al.
Nutburn, Proceedings of Microtest, Brighton, England, Apr. 2-5, 1979, pp. 52-65.
Farnholtz, The W. E. Engineer, vol. XXV, No. 3, Fall 1981, pp. 3-9.
Belt et al., New Electronics, vol. 14, No. 22, Nov. 10, 1981, pp. 44, 49.
Jensen et al., "Burn-In", John Wiley & Sons, 1982, pp. 1, 47-75.
Brown, New Electronics, vol. 14, No. 22, Nov. 10, 1981, pp. 78-80.
Colman et al., Southcon/82 Conf. Rec., Mar. 23-25, 1982, Orlando, Fla., pp. 20/2.1-20/2.5.
American Telephone and Telegraph Company AT&T Bell Laboratories
Gruber Felix D.
Pfeifle Erwin W.
LandOfFree
Technique for the operational life test of microprocessors does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Technique for the operational life test of microprocessors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Technique for the operational life test of microprocessors will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1072349