Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se
Reexamination Certificate
2011-05-24
2011-05-24
Nguyen, Vinh P (Department: 2858)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
C324S612000, C324S613000, C324S762010, C324S762020
Reexamination Certificate
active
07948228
ABSTRACT:
To accurately measure power source noise generated inside an integrated circuit, the power source noise measuring device comprises: a mutual inductor pair placed inside an integrated circuit, the mutual inductor pair including (i) a first inductor connected to between power source voltages of the integrated circuit and (ii) a second inductor arranged opposite the first inductor, the both ends of which second inductor are connected to external output terminals; and a power source noise measuring unit which measures power source noise of the integrated circuit on the basis of a voltage waveform output from the second inductor of said mutual inductor pair via the external output terminals.
REFERENCES:
patent: 6823293 (2004-11-01), Chen et al.
patent: 6842027 (2005-01-01), Liu et al.
patent: 7116114 (2006-10-01), Kajita
patent: 7365548 (2008-04-01), Neuman
patent: 7443187 (2008-10-01), Jenkins et al.
patent: 2004/0128115 (2004-07-01), Chen et al.
patent: 2005/0114054 (2005-05-01), Shimazaki et al.
patent: 2005/0165573 (2005-07-01), Takamiya et al.
patent: 2006/0227230 (2006-10-01), Kindem et al.
patent: 2008/0030254 (2008-02-01), Arsovski et al.
patent: 410051295 (1998-02-01), None
patent: 2001-53231 (2001-02-01), None
U.S. Appl. No. 11/737,215, filed Apr. 19, 2007, Takahiro Takemoto, et al., Fujitsu Limited.
European Patent Office Search Report issued Dec. 19, 2007, for corresponding European Patent Application No. 07106889.4.
Office Action mailed Jun. 19, 2009 in U.S. Appl. No. 11/737,215.
Notice of Allowance and Fee(s) Due mailed Aug. 25, 2009 in U.S. Appl. No. 11/737,215.
Supplemental Notice of Allowability mailed Sep. 14, 2009 in U.S. Appl. No. 11/737,215.
Furuya Kazuhiro
Harada Akihiko
Takemoto Takahito
Fujitsu Limited
Nguyen Vinh P
Staas & Halsey , LLP
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