Technique for increasing manufacturing yield of matrix-addressab

Details Technique for increasing manufacturing yield of matrix-addressab Technique for increasing manufacturing yield of matrix-addressab

1995-10-24

1999-04-27

Ramsey, Kenneth J.

Electric lamp or space discharge component or device manufacturi

Process

With testing or adjusting

445 24, H01J 942

Patent

active

058974148

ABSTRACT:
The yield in manufacturing matrix-addressable devices, particularly flat-panel CRT displays, is increased by a technique in which a determination is first made that a defect exists in part of a first matrix-addressable plate structure (20) of a unitary first active area (32). This typically entails testing a group of the first plate structures to determine whether any of them are defective. The defective part or parts of each defective first plate structure are also identified. At least one non-defective first plate structure normally is subsequently converted into a first matrix-addressable device of the first active area. For a defective first plate structure identified in the testing, the defective part of the structure is removed in such a way that the remainder of the structure forms a second matrix-addressable plate structure (84) of a second active area (32A) smaller than the first active area. The second plate structure is normally tested and, if non-defective, is subsequently converted into a second matrix-addressable device.

REFERENCES:
patent: 3940740 (1976-02-01), Coontz
patent: 4820222 (1989-04-01), Holmberg et al.
patent: 4840459 (1989-06-01), Strong
patent: 5162931 (1992-11-01), Holmberg
Mueller, "Tiling Thin-Film Electroluminescent Displays", SID 91 Digest, 1991, pp. 567-570.

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