Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-07-04
2006-07-04
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S538000, C379S399010, C370S252000
Reexamination Certificate
active
07071703
ABSTRACT:
A method and apparatus for pre-qualifying lines with respect to estimating the insertion loss of the line is presented. End-to-end insertion loss at high frequencies is estimated from measurements made at low frequencies through the voice switch at the central office of a telephone company. An AC voltage waveform is applied to the telephone line being tested. Real and imaginary components of the resultant waveform are measured. These measurements are captured and used to estimate the insertion loss of the telephone line at frequencies in the range of 40 kHz to 300 kHz.
REFERENCES:
patent: 3882287 (1975-05-01), Simmonds
patent: 4087657 (1978-05-01), Peoples
patent: 4186283 (1980-01-01), Simmonds
patent: 4529847 (1985-07-01), DeBalko
patent: 4620069 (1986-10-01), Godwin et al.
patent: 4868506 (1989-09-01), DiStefano
patent: 5025221 (1991-06-01), Blaess
patent: 5083086 (1992-01-01), Steiner
patent: 5121420 (1992-06-01), Marr et al.
patent: 5128619 (1992-07-01), Bjork et al.
patent: 5157336 (1992-10-01), Crick
patent: 5270661 (1993-12-01), Burnett
patent: 5302905 (1994-04-01), Crick
patent: 5319311 (1994-06-01), Kawashima et al.
patent: 5400321 (1995-03-01), Nagato
patent: 5402073 (1995-03-01), Ross
patent: 5404388 (1995-04-01), Eu
patent: 5436953 (1995-07-01), Nilson
patent: 5461318 (1995-10-01), Borchert et al.
patent: 5465287 (1995-11-01), Egozi
patent: 5528661 (1996-06-01), Siu et al.
patent: 5528679 (1996-06-01), Taarud
patent: 5606592 (1997-02-01), Galloway et al.
patent: 5629628 (1997-05-01), Hinds et al.
patent: 5636202 (1997-06-01), Garney
patent: 5680391 (1997-10-01), Barron et al.
patent: 5699402 (1997-12-01), Bauer et al.
patent: 5758027 (1998-05-01), Meyers et al.
patent: 5790523 (1998-08-01), Ritchie, Jr. et al.
patent: 5864602 (1999-01-01), Needle
patent: 5870451 (1999-02-01), Winkler et al.
patent: 5881130 (1999-03-01), Zhang
patent: 5937033 (1999-08-01), Bellows
patent: 5956386 (1999-09-01), Miller
patent: 5978449 (1999-11-01), Needle
patent: 6002671 (1999-12-01), Kahkoska et al.
patent: 6014425 (2000-01-01), Bingel et al.
patent: 6026145 (2000-02-01), Bauer et al.
patent: 6084946 (2000-07-01), Beierle
patent: 6091338 (2000-07-01), Natra
patent: 6091713 (2000-07-01), Lechleider et al.
patent: 6107867 (2000-08-01), Lakshmikumar
patent: 6111861 (2000-08-01), Burgess
patent: 6115466 (2000-09-01), Bella
patent: 6118860 (2000-09-01), Hillson et al.
patent: 6154447 (2000-11-01), Vedder
patent: 6169785 (2001-01-01), Okazaki
patent: 6177801 (2001-01-01), Chong et al.
patent: 6181775 (2001-01-01), Bella
patent: 6192109 (2001-02-01), Amrany et al.
patent: 6205202 (2001-03-01), Yoshida et al.
patent: 6209108 (2001-03-01), Pett et al.
patent: 6215854 (2001-04-01), Walance
patent: 6215855 (2001-04-01), Schneider
patent: 6226356 (2001-05-01), Brown
patent: 6240177 (2001-05-01), Guntzburger et al.
patent: 6256377 (2001-07-01), Murphree et al.
patent: 6263047 (2001-07-01), Randle et al.
patent: 6263048 (2001-07-01), Nelson et al.
patent: 6266395 (2001-07-01), Liu et al.
patent: 6285653 (2001-09-01), Koeman et al.
patent: 6292468 (2001-09-01), Sanderson
patent: 6292539 (2001-09-01), Eichen et al.
patent: 6349130 (2002-02-01), Posthuma et al.
patent: 6366644 (2002-02-01), Sisk et al.
patent: 6385297 (2002-05-01), Faulkner et al.
patent: 6389109 (2002-05-01), Schmidt et al.
patent: 6445733 (2002-09-01), Zuranski et al.
patent: 6456694 (2002-09-01), Posthuma
patent: 6463126 (2002-10-01), Manica et al.
patent: 6466647 (2002-10-01), Tennyson
patent: 6487276 (2002-11-01), Rosen et al.
patent: 6507870 (2003-01-01), Yokell et al.
patent: 6614880 (2003-09-01), Lysaght et al.
patent: 6687336 (2004-02-01), Holeva
patent: 6741676 (2004-05-01), Rudinsky et al.
patent: 6781386 (2004-08-01), Le Henaff
patent: 2002/0089999 (2002-07-01), Binde
patent: 2003/0048756 (2003-03-01), Chang et al.
patent: 0722164 (1996-07-01), None
patent: WO 91/11872 (1991-08-01), None
patent: WO 98/44428 (1998-10-01), None
patent: WO 99/63427 (1999-12-01), None
patent: WO 00/27134 (2000-05-01), None
patent: WO 00/64132 (2000-10-01), None
patent: WO 01/01597 (2001-01-01), None
patent: WO 01/24490 (2001-04-01), None
patent: WO 01/67729 (2001-09-01), None
Backer, et al., “Telephone Access Network Measurements,” 1998, Tektronix XP002148949.
Boets, et al. “The Modelling Aspect of Transmission Line Networks,” May 12, 1992, pp. 137-141.
Chiu et al. “Loop Survey in the Taiwan Area and Feasibility Study for HDSL,” IEEE, vol. 9, No. 6, Aug. 1991, pp. 801-809.
Eichen, et al., “DSTS: An Expert System for Diagnosis of Advanced Digital Subscriber Services,” IEEE Network Operations and Management Symposium, U.S. NY, vol. Conf. 10, pp. 794-804.
Goralski, “xDSL Loop Qualification and Testing,” IEEE Communications Magazine, May 1999.
Harris Communications, National Communications forum Presentation, Chicago, IL Oct. 5, 1998.
Harris White Paper, “Testing in the Unbundled Loop: The Challenge for ILECS and C:ECS”. pp. 1-.
Hedlund, et al., DSL Loop Test Telephony, vol. 235, No. 8, Aug. 24, 1998.
Heikman Product Information Release, “Introducing Hekimian's Comprehensive ADSL Test Solution,”.
IEEE Std 743-1995 “IEEE Standard Equipment Requirements and Measurement Techniques for Analog Transmission Parameters for Telecommunications” 1996.
“Loop Qualification, Prerequisite for Volume xDSL Deployment,” The TeleChoice Report on xDSL, vol. 2, No. 3, Mar. 1997.
“Network and Customer Installation Interfaces—Asymmetric Digital Subscriber Line (ADSL) Metallic Interface,” ANSI T10413-1998. Revision of ASSI T1. 413-1995 (Not Published).
Stewart, “Testing ADSL: The Easier the Better, America's Network,” Dec. 15, 1998 pp. 24-27.
Turnstone Systems, Inc., Product Literature and Presentation at Turnstone Systems, Inc., Sep. 1992.
Roehrkasten, “Meassung Von SDSL=Parametern”, Nachrichtentechnik Electronik, DE Veb Verlag Technik, Berlin, vol. 48, No. 2, Mar. 1, 1998, pp. 20-21.
Rye Senjen et al, “Hybrid Expert Systems for Monitoring and for Diagnosis”, proceedings of the Conference on Artificial Intelligence for Applications, IEEE, Comp. Soc. Press. vol. Conf. 9, Mar. 1, 1993, pp. 235-241.
Woloszynski, “It's Here,” Bellcore Exchange Magazine, Jun. 1998.
Zieman, “ADSL Line Qualification Tests,” Online!, Wandel and Goltermann, http://www.wg.com/appnotes/adsltest.html.
Nguyen Vincent Q.
Teradyne, Inc.
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