Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified configuration
Reexamination Certificate
2011-06-21
2011-06-21
Landau, Matthew C (Department: 2813)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified configuration
C257S382000, C257SE29120, C257SE29122, C257SE29299, C257SE21641
Reexamination Certificate
active
07964970
ABSTRACT:
By locally adapting the size and/or density of a contact structure, for instance, within individual transistors or in a more global manner, the overall performance of advanced semiconductor devices may be increased. Hence, the mutual interaction between the contact structure and local device characteristics may be taken into consideration. On the other hand, a high degree of compatibility with conventional process strategies may be maintained.
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Feudel Thomas
Gerhardt Martin
Griebenow Uwe
Richter Ralf
GlobalFoundries Inc.
Hall Jessica
Landau Matthew C
Williams Morgan & Amerson P.C.
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