Technique for diagnosing and screening optical interconnect...

Details Technique for diagnosing and screening optical interconnect... Technique for diagnosing and screening optical interconnect...

2005-06-03

2008-12-16

Chowdhury, Tarifur R. (Department: 2886)

Optics: measuring and testing

Inspection of flaws or impurities

Surface condition

Reexamination Certificate

active

07466404

ABSTRACT:
A method for testing a substrate by using a photoemission microscope is provided which includes providing the substrate and applying a reverse bias voltage to the substrate. The method further includes detecting light emissions from a top surface of the substrate and characterizing viability of the substrate from the detection of the light emissions.

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