Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-02-16
2009-06-02
Barbee, Manuel L. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S064000, C702S079000, C702S117000, C324S532000
Reexamination Certificate
active
07542857
ABSTRACT:
A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second response on the first transmission line from a single pulse transmitted on at least one second transmission line, wherein the at least one second transmission line is substantially adjacent to the first transmission line. The worst case bit sequences for transmission on the first transmission line and the at least one second transmission line are then determined based upon the first response and the second response for determining performance characteristics associated with the first transmission line.
REFERENCES:
patent: 3288929 (1966-11-01), Hutchinson
patent: 3678194 (1972-07-01), Orrell, Jr.
patent: 4590600 (1986-05-01), Beeman et al.
patent: 5110211 (1992-05-01), Niki et al.
patent: 5361398 (1994-11-01), Christian et al.
patent: 5524112 (1996-06-01), Azuma et al.
patent: 5566214 (1996-10-01), Kroeger et al.
patent: 5633607 (1997-05-01), Millar
patent: 5742798 (1998-04-01), Goldrian
patent: 5748672 (1998-05-01), Smith et al.
patent: 5793800 (1998-08-01), Jylha et al.
patent: 5848100 (1998-12-01), Inogai
patent: 5914996 (1999-06-01), Huang
patent: 5982208 (1999-11-01), Kokubo et al.
patent: 6070214 (2000-05-01), Ahern
patent: 6128319 (2000-10-01), Ngai
patent: 6205202 (2001-03-01), Yoshida et al.
patent: 6327542 (2001-12-01), McBride
patent: 6374392 (2002-04-01), Ochiai et al.
patent: 6418494 (2002-07-01), Shatas
patent: 6539527 (2003-03-01), Naffziger et al.
patent: 6578180 (2003-06-01), Tanner
patent: 6625239 (2003-09-01), Shiraishi et al.
patent: 6633605 (2003-10-01), Katsman et al.
patent: 6775809 (2004-08-01), Lambrecht et al.
patent: 7065168 (2006-06-01), Dedic et al.
patent: 2005/0002423 (2005-01-01), Lambrecht et al.
patent: 2006/0195805 (2006-08-01), Matsumiya
patent: 0 262 659 (1988-04-01), None
patent: 0 508 459 (1992-10-01), None
patent: 2000-035831 (2000-02-01), None
Rubio et al. “An Approach to the Analysis and Detection of Crosstalk Faults in Digital VLSI Circuits”, Mar. 1994. Computer-Aided Design of Integrated Circuits and Systems, vol. 13, Issue 3. pp. 387-395.
Horowitz Mark A.
Liaw Haw-Jyh
Yuan Xiangchao
Barbee Manuel L.
Hunton & Williams LLP
Rambus Inc.
LandOfFree
Technique for determining performance characteristics of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Technique for determining performance characteristics of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Technique for determining performance characteristics of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4127073