Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-02-28
2006-02-28
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S064000, C702S079000, C702S117000, C324S532000
Reexamination Certificate
active
07006932
ABSTRACT:
A technique for determining performance characteristics of electronic devices and systems is disclosed in one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second response on the first transmission line from a single pulse transmitted on at least one second transmission line, wherein the at least one second transmission line is substantially adjacent to the first transmission line. The worst case bit sequences for transmission on the first transmission line and the at least one second transmission line are then determined based upon the first response and the second response for determining performance characteristics associated with the first transmission line.
REFERENCES:
patent: 3288929 (1966-11-01), Hutchinson
patent: 3678194 (1972-07-01), Orrell, Jr.
patent: 4590600 (1986-05-01), Beeman et al.
patent: 5110211 (1992-05-01), Niki et al.
patent: 5361398 (1994-11-01), Christian et al.
patent: 5566214 (1996-10-01), Kroeger et al.
patent: 5742798 (1998-04-01), Goldrian
patent: 5982208 (1999-11-01), Kokubo et al.
patent: 6128319 (2000-10-01), Ngai
patent: 6205202 (2001-03-01), Yoshida et al.
patent: 6327542 (2001-12-01), McBride
patent: 6539527 (2003-03-01), Naffziger et al.
patent: 6578180 (2003-06-01), Tanner
patent: 6625239 (2003-09-01), Shiraishi et al.
patent: 6633605 (2003-10-01), Katsman et al.
patent: 6775809 (2004-08-01), Lambrecht et al.
patent: 262659 (1988-04-01), None
patent: 508459 (1992-10-01), None
patent: 2000-35831 (2000-02-01), None
Horowitz Mark A.
Liaw Haw-Jyh
Yuan Xingchao
Barbee Manuel L
Hoff Marc S.
Hunton & Williams
Rambus Inc.
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