Data processing: measuring – calibrating – or testing – Measurement system – History logging or time stamping
Reexamination Certificate
2006-06-06
2009-10-27
Cosimano, Edward R (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
History logging or time stamping
C702S001000, C702S033000, C702S034000, C702S127000, C702S182000
Reexamination Certificate
active
07610176
ABSTRACT:
A computing device is provided on which device analysis information is generated. The device analysis information may be generated from the use of diagnostic and monitoring applications and code. The device analysis information is handled by an application/central processor and then stored on a removeable storage device.
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Chan Bennett
Kim James
Shi Jason Jianxiong
Tu Jerome
Cosimano Edward R
Mahamedi Paradice Kreisman LLP
Palm Inc.
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