Technique for collecting information about computing devices

Data processing: measuring – calibrating – or testing – Measurement system – History logging or time stamping

Reexamination Certificate

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Details

C702S001000, C702S033000, C702S034000, C702S127000, C702S182000

Reexamination Certificate

active

07610176

ABSTRACT:
A computing device is provided on which device analysis information is generated. The device analysis information may be generated from the use of diagnostic and monitoring applications and code. The device analysis information is handled by an application/central processor and then stored on a removeable storage device.

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