Technique for calibrating electronic devices

Details Technique for calibrating electronic devices Technique for calibrating electronic devices

2006-12-12

2006-12-12

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Calibration

Reexamination Certificate

active

07148699

ABSTRACT:
A technique for calibrating a second electronic device using a first electronic device having a reference characteristic is disclosed. In one particular exemplary embodiment, the technique may be realized as a method for calibrating a second electronic device using a first electronic device, wherein the first electronic device has a reference characteristic, wherein the second electronic device has an adjustable element, and wherein the first electronic device and the second electronic device are interconnected via one or more signal lines. The method comprises generating a first value based at least in part upon the reference characteristic, and providing the first value to the second electronic device via one of the one or more signal lines. The method also comprises generating a second value, based at least in part upon the first value, using the adjustable element. The method further comprises comparing the second value to the first value, and adjusting the adjustable element so as to modify the second value until the second value substantially matches the first value.

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patent: 6617888 (2003-09-01), Volk
patent: 6636081 (2003-10-01), Lee
patent: 6713996 (2004-03-01), Di Iorio
patent: 2000-35831 (2000-02-01), None

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