Technique for achieving preferred optical alignment in a scannin

Details Technique for achieving preferred optical alignment in a scannin Technique for achieving preferred optical alignment in a scannin

1995-06-06

1997-08-12

Epps, Georgia Y.

Optics: measuring and testing

By particle light scattering

With photocell detection

356358, G01B 902

Patent

active

056571224

ABSTRACT:
Alignment circuity and calibration method for a scanning interferometer. Phase shifts are introduced into the alignment servo to maximize overall modulation efficiency.

REFERENCES:
patent: 4053231 (1977-10-01), Fletcher et al.
patent: 4480914 (1984-11-01), Thompson et al.

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