Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-09-26
2006-09-26
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S054000, C702S056000, C702S078000, C324S236000, C324S239000, C073S054240, C073S064530
Reexamination Certificate
active
07113876
ABSTRACT:
Circuitry adapted for carrying out associated techniques for: (a) calculating a damping factor, e.g., a damping ratio represented by ζ, or a quality factor Q, where ζ≈1/2Q, for a transient signal received, having been emitted from a resonator-type sensor element; (b) determining amplitude, A, of the transient signal; or (c) generating a frequency response dataset of interrelated points for the transient signal. A threshold comparison circuit is included for converting the transient signal received into a first and second digital waveform; the first digital waveform represents cycle crossings of the transient signal associated with a first threshold value, and the second digital waveform represents cycle crossings of the transient signal associated with a second threshold value. The transient signal may be converted, likewise, into third, and so on, digital waveforms, whereby the third digital waveform represents cycle crossings of the transient signal associated with a third threshold value. Respective digital counters are included, each of which is adapted for determining a total number of cycles of the first, second, third, and so on, digital waveform. A processing unit of suitable speed and capacity is employed for the calculating of the damping factor, determining an amplitude, and/or generating a frequency response dataset.
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Grimes Craig A.
Ong Keat G.
Zeng Kefeng
Barbee Manuel L
Hoff Marc S.
Macheledt Bales & Heidmiller LLP
SenTech Biomed Corporation
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