Image analysis – Applications – Manufacturing or product inspection
Patent
1997-02-13
1998-10-13
Vu, Kim Yen
Image analysis
Applications
Manufacturing or product inspection
382147, 382149, 348126, G06K 900
Patent
active
058224491
ABSTRACT:
An operator actuates keyboard (22) to register board name of a board for teaching (ST11), sets a reference board (1S) on a Y-axis table unit (4) to actuate a start key (ST12), inputs reference points of the reference board (1S) to be set to an original position (ST13), takes a picture of a predetermined area on the reference board to teach a mounting position (ST14), and reads data about component image and its decision criteria of the corresponding component from a component kind table (19) to be stored as teaching data (ST15). This operation is repeatedly executed until all components are taught to a mounted component inspection device which inspects mounting qualities of a plurality of components mounted on an inspected board.
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Kobayashi Shigeki
Yamamoto Norihito
Omron Corporation
Vu Kim Yen
Williams Kimberly A.
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