Teach and repeat probe for a robot arm

Details Teach and repeat probe for a robot arm Teach and repeat probe for a robot arm

1991-02-14

1993-06-01

Noland, Tom

Geometrical instruments

Gauge

Pivoted probes

33561, 901 10, G01B 700, G01B 731

Patent

active

052148580

ABSTRACT:
A probe used for programming a robot arm in order to perform a cutting operation on a work-piece. During the programming operation, the probe is attached to the robot arm and moved around the profile of a test-piece. An electric lamp is provided for indicating contact between the probe and the test piece. Additional circuitry including an electric lamp is provided for indicating when the body of the probe and a pin (4) having an end tip (8) which actually forms the contracting portion of the probe are misaligned.

REFERENCES:
patent: 2941140 (1960-01-01), Rudolf, Jr. et al.
patent: 3821855 (1974-07-01), Baker et al.
patent: 3840994 (1974-10-01), Izumi et al.
patent: 4043046 (1977-08-01), Thomas
patent: 4138823 (1979-02-01), McMurtry
patent: 4477976 (1984-10-01), Suzuki
patent: 4477978 (1984-10-01), Azuma
patent: 4638668 (1987-01-01), Leverberg et al.
patent: 4696190 (1987-09-01), Bucher et al.
patent: 4865008 (1986-01-01), Stolben

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