TDR tester for x-y prober

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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Details

324533, 324754, G01R 3102, G01R 3111

Patent

active

060519789

ABSTRACT:
A printed circuit board tester for testing matched impedance test sites on a printed circuit board comprising an x-y prober having a first prober head and a second prober head above the printed circuit board connected to a time domain reflectometer by a coaxial test cable. A signal probe is attached to one of the prober heads. The test cable includes a signal wire which is electrically connected to the signal probe and includes a ground shield electrically connected to a ground shield extender positioned around the signal probe. A separate ground probe is connected to the second prober head and includes a ground spring for temporarily contacting the ground shield extender to transmit ground signals to the ground shield of the test cable.

REFERENCES:
patent: 4565966 (1986-01-01), Burr et al.
patent: 5006808 (1991-04-01), Watts
patent: 5744964 (1998-04-01), Sudo et al.

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