Electrical connectors – With supporting means for coupling part – Coupling part or mating part extending into panel opening
Reexamination Certificate
2007-10-23
2007-10-23
Harvey, James R. (Department: 2833)
Electrical connectors
With supporting means for coupling part
Coupling part or mating part extending into panel opening
C439S935000
Reexamination Certificate
active
10476795
ABSTRACT:
An electron beam apparatus comprises a TDI sensor (64) and a feed-through device (50). The feed-through device has a socket contact (54) for interconnecting a pin (52) attached to a flanged (51) for separating different environments. The other pin (53) making a pair with the pin (52) and the socket contact (54) together construct a connecting block, and the socket contact (54) has an elastic member (61). The pin (53) is connected with the TDI sensor (64), in which a pixel array has been adaptively configured based on the optical characteristic of an image projecting optical system. That sensor has a number of integration stages that can reduce the field of view of the image projecting optical system. Further, the number of integration stage may be determined such that the data rate of the TDI sensor would not be reduced but the number of pins would not be increased as much as possible. Preferably, the number of line count may be almost equal to the number of integration stages.
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Office Action issued Jul. 11, 2007 in the Japanese Patent Office in a counterpart patent application.
Hatakeyama Masahiro
Murakami Takeshi
Noji Nobuharu
Satake Tohru
Watanabe Kenji
Ebara Corporation
Harvey James R.
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