Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-01-30
2007-01-30
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S551000, C324S762010
Reexamination Certificate
active
10895285
ABSTRACT:
A Time Dependent Dielectric Breakdown (TDDB) test pattern circuit, which can reduce testing time and statistically improve a precision of measurement as well as a method for testing the test pattern circuit are discussed. Typically, a test pattern circuit includes in plurality of unit test patterns. Each unit test pattern includes a capacitor connected to a stress voltage. The stress voltage is applied to the capacitor and the current flowing from the capacitor is measured over time. The dielectric in the capacitor breaks down over time and at a certain point, the current from the capacitor changes suddenly. Unfortunately, the convention test pattern circuit requires serial testing of each unit cell, and therefore, the measuring time is significant when there are many unit cells involved. The circuit allows for the measurements to take place simultaneously for all unit cells within the test pattern circuit. This greatly reduces the testing time, allows for greater amount of data to be obtained which improves the statistically accuracy, and reduces costs as well.
REFERENCES:
patent: 3833865 (1974-09-01), Palmer
patent: 3883825 (1975-05-01), Cohen
patent: 3919668 (1975-11-01), Minami et al.
patent: 4571505 (1986-02-01), Eaton, Jr.
patent: 4904946 (1990-02-01), Hirai
patent: 4922135 (1990-05-01), Mollier et al.
patent: 5049841 (1991-09-01), Cooper et al.
patent: 5220306 (1993-06-01), Shimizu
patent: 5420513 (1995-05-01), Kimura
patent: 5610429 (1997-03-01), Crafts
patent: 5612917 (1997-03-01), Kozaru et al.
patent: 5621629 (1997-04-01), Hemminger et al.
patent: 5625218 (1997-04-01), Yamadera et al.
patent: 5654588 (1997-08-01), Dasse et al.
patent: 5777931 (1998-07-01), Kwon et al.
patent: 5841164 (1998-11-01), Tsujino
patent: 5886363 (1999-03-01), Hamada et al.
patent: 6067597 (2000-05-01), Kozaru
patent: 6115283 (2000-09-01), Hidaka
patent: 6249410 (2001-06-01), Ker et al.
Birch & Stewart Kolasch & Birch, LLP
Karlsen Ernest
LG Semicon Co. Ltd.
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