Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-12-05
2006-12-05
Tran, Phuoc (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
Reexamination Certificate
active
07146034
ABSTRACT:
A tape manufacturing system and a tape-surface-inspection unit are disclosed. The tape-surface-inspection unit is capable of continuously characterizing the surface of a non-transparent tape that is usable with or without a tape manufacturing system. The tape-surface-inspection unit includes a surface illuminator, an imager, an image processor, a tape guide, and, optionally, an indexer. The surface illuminator provides a tape surface located by the tape guide in a manner that allows the imager to capture images for characterization by the image processor. The indexer facilitates a correlation of locations along the tape and a characterization of the locations on the tape. The tape manufacturing system, in addition to at least one tape-surface-inspection unit, includes a tape-processing unit, a tape handler, and a controller.
REFERENCES:
patent: 3825351 (1974-07-01), Seki, et al.
patent: 3971956 (1976-07-01), Jakeman
patent: 4049052 (1977-09-01), Arendt
patent: 4079482 (1978-03-01), Yeh
patent: 4110047 (1978-08-01), Takahashi
patent: 4145140 (1979-03-01), Fujii
patent: 4247907 (1981-01-01), Durbeck
patent: 4281342 (1981-07-01), Ueda
patent: 4290698 (1981-09-01), Milana
patent: 4344127 (1982-08-01), McDaniel
patent: 4396976 (1983-08-01), Hyatt
patent: 4646223 (1987-02-01), Sekiguchi
patent: 4661001 (1987-04-01), Takai
patent: 4671663 (1987-06-01), Sick
patent: 4673818 (1987-06-01), Guerra
patent: 4675730 (1987-06-01), Adomaitis et al.
patent: 4836680 (1989-06-01), Troster et al.
patent: 4889367 (1989-12-01), Miller
patent: 4916600 (1990-04-01), Ropelato
patent: RE33387 (1990-10-01), Binnig
patent: 4978219 (1990-12-01), Bessho
patent: 5153418 (1992-10-01), Batterman
patent: 5170044 (1992-12-01), Pastor
patent: 5189292 (1993-02-01), Batterman
patent: 5189490 (1993-02-01), Shetty
patent: 5288986 (1994-02-01), Pine et al.
patent: 5289004 (1994-02-01), Okada
patent: 5296693 (1994-03-01), Hughes-Hartogs
patent: 5298731 (1994-03-01), Ett
patent: 5304787 (1994-04-01), Wang
patent: 5334844 (1994-08-01), Pollard et al.
patent: 5351200 (1994-09-01), Impink, Jr.
patent: 5355001 (1994-10-01), Fujimoto
patent: 5357094 (1994-10-01), Baldwin
patent: 5383776 (1995-01-01), Trail et al.
patent: 5412980 (1995-05-01), Elings
patent: 5468945 (1995-11-01), Huggett
patent: 5519212 (1996-05-01), Elings
patent: 5526116 (1996-06-01), Castro
patent: 5563401 (1996-10-01), Lemelson
patent: 5579218 (1996-11-01), Ehlig et al.
patent: 5608527 (1997-03-01), Valliant
patent: 5643368 (1997-07-01), Nakashima
patent: 5689415 (1997-11-01), Calotychos
patent: 5726912 (1998-03-01), Krall, Jr.
patent: 5739086 (1998-04-01), Goyal
patent: 5741377 (1998-04-01), Goyal
patent: 5742172 (1998-04-01), Yasutake
patent: 5760300 (1998-06-01), Kajimura
patent: 5828449 (1998-10-01), King et al.
patent: 5872080 (1999-02-01), Arendt
patent: 5898020 (1999-04-01), Goyal
patent: 5898106 (1999-04-01), Babcock
patent: 5956134 (1999-09-01), Roy et al.
patent: 5958599 (1999-09-01), Goyal
patent: 5964966 (1999-10-01), Goyal
patent: 5980078 (1999-11-01), Krivoshein
patent: RE36488 (2000-01-01), Elings
patent: 6022832 (2000-02-01), Fritzemeier
patent: 6027564 (2000-02-01), Fritzemeier
patent: 6032861 (2000-03-01), Lemelson
patent: 6055446 (2000-04-01), Kroeger et al.
patent: 6106615 (2000-08-01), Goyal
patent: 6156376 (2000-12-01), Paranthaman
patent: 6190752 (2001-02-01), Do et al.
patent: 6236044 (2001-05-01), Chou et al.
patent: 6246054 (2001-06-01), Toda
patent: 6248009 (2001-06-01), Ito
patent: 6331199 (2001-12-01), Goyal
patent: 6339047 (2002-01-01), Christopherson et al.
patent: 6383989 (2002-05-01), Jia
patent: 6426320 (2002-07-01), Fritzemeier
patent: 6427345 (2002-08-01), Alvis
patent: 6447714 (2002-09-01), Goyal
patent: 6451450 (2002-09-01), Goyal
patent: 6453691 (2002-09-01), Seo
patent: 6458223 (2002-10-01), Hans Thieme
patent: 6475311 (2002-11-01), Fritzemeier
patent: 6562761 (2003-05-01), Fritzemeier
patent: 6599346 (2003-07-01), Goyal
patent: 6602313 (2003-08-01), Goyal
patent: 6607838 (2003-08-01), Goyal
patent: 6607839 (2003-08-01), Goyal
patent: 6610413 (2003-08-01), Goyal
patent: 6610414 (2003-08-01), Goyal
patent: 6610632 (2003-08-01), Honjo
patent: 6623607 (2003-09-01), Stollenwerk
patent: 6541121 (2003-11-01), Jeong
patent: 2004/0018394 (2004-01-01), Jia et al.
patent: 2004/0023077 (2004-02-01), Jia et al.
patent: 2004/0206952 (2004-10-01), Jia et al.
patent: 0284630 (1988-10-01), None
patent: WO 01/56128 (2001-08-01), None
patent: WO 03/082566 (2003-10-01), None
International Search Report mailed on Jun. 23, 2005 in connection with PCT/US2004/037133.
Written Opinion of the International Searching Authority mailed on Jun. 23, 2005 in connection with PCT/US2004/037133.
Communication Relating To The Results of the Partial International Search (Annex to Form PCT/ISA/1206—Invitation to Pay Additional Fees) mailed on Apr. 22, 2005 in connection with PCT/US2004/037133.
“Tropel Lasercheck Non-Contact Surface Roughness,” Coming Tropel Corporation, 2 pages; date unknown.
“diEnviroScope ATomic Force Microscope,” 2003 Veeco Instruments Inc., 2 pages; date unknown.
“Atomic Force Microscopy for Nan-Surface Texture/Roughness:” Pacific Nanotechnology, Inc., 3 pages; date unknown.
“Using the Dimension X3D AFM in Advanced Photomask Metrology”, 2003 Veeco Instruments, Inc., 6 pages; date unknown.
Qiao Yunfei
Reeves Jodi L.
Larson Newman Abel Polansky & White LLP
Superpower, Inc.
Tran Phuoc
LandOfFree
Tape manufacturing system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Tape manufacturing system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Tape manufacturing system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3719526