Tandem mass spectrometry systems based on time-of-flight analyze

Details Tandem mass spectrometry systems based on time-of-flight analyze Tandem mass spectrometry systems based on time-of-flight analyze

1991-10-18

1993-04-27

Berman, Jack I.

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

250281, 250282, H01J 4926

Patent

active

052065081

ABSTRACT:
A tandem mass spectrometry system, capable of obtaining tandem mass spectra for each parent ion without separation of parent ions of differing mass from each other, comprising an ion source, (1) a particle detector (6), two separated time-of-flight devices (3, 5) between the source and the detector, a control ion-excitation device (4) between the time-of-flight devices, and means measuring a time-of-flight for particles reaching the detector (6), all of which lie on a common ion path, and wherein ion optics maintain ion flight from the source within the ion path and a computer control system controls the excitation device (4) and the optics.

REFERENCES:
patent: 4234791 (1980-11-01), Enke et al.
patent: 4894536 (1990-01-01), Conzemius
patent: 4988869 (1991-01-01), Aberth
patent: 5032722 (1991-07-01), Boesl et al.
patent: 5073713 (1991-12-01), Smith et al.
Tandem Quadrupole/Time-of-Flight Instrument for Mass Spectrometry/Mass Spectrometry, Glish & Goeringer, Anal. Chem 1984, 56, 2291-2295.
"Photodissociation of size-selected, . . . " C. Brechignac, et al. Mar. 1, 1988, pp. 3022-3027.
"A Tandem Time-of-Flight Mass Spectrometer, . . . ", R. G. Cooks, et al., Feb. 2, 1987, pp. 49-61.

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