Optics: measuring and testing – Document pattern analysis or verification
Reexamination Certificate
2007-07-31
2010-02-23
Punnoose, Roy (Department: 2886)
Optics: measuring and testing
Document pattern analysis or verification
C235S491000
Reexamination Certificate
active
07667828
ABSTRACT:
A tagging system contains first taggants and second taggants. The taggants differ from each other so that the first taggants have a first emission spectrum and a first absorption edge and the second taggants have a second emission spectrum and a second absorption edge. In the tagging system, the first taggants are arranged to be within an interaction distance of the second taggants so that energy transfer between the first taggants and the second taggants causes an emission spectrum of the tagging system to differ from a sum of the first emission spectrum and the second emission spectrum.
REFERENCES:
patent: 6570648 (2003-05-01), Muller-Rees et al.
patent: 6846565 (2005-01-01), Korgel et al.
patent: 6918946 (2005-07-01), Korgel et al.
patent: 7008559 (2006-03-01), Chen
patent: 7501092 (2009-03-01), Chen
patent: 2003/0003300 (2003-01-01), Korgel et al.
patent: 2003/0034486 (2003-02-01), Korgel
patent: 2005/0243305 (2005-11-01), Vig et al.
patent: 2005/0266697 (2005-12-01), Korgel et al.
patent: 2005/0267345 (2005-12-01), Korgel et al.
patent: 2009/0074649 (2009-03-01), Korgel et al.
Bockstaller, M. et al., “Size-Selective Organization of Enthalpic Compatibilized Nanocrystals in Ternary Block Copolymer/Particle Mixtures” J Am Chem Soc 125:5276-5277 (2003).
Shevchenko, Elena et al, “Structural Diversity in Binary Nanoparticle Superlattices” Nature Letters vol. 439, 55-59 (2006).
Hewlett--Packard Development Company, L.P.
Punnoose Roy
LandOfFree
Tagging systems using energy exchange does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Tagging systems using energy exchange, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Tagging systems using energy exchange will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4195460