Communications: electrical – Condition responsive indicating system – Specific condition
Reexamination Certificate
2008-09-16
2008-09-16
Bugg, George A (Department: 2612)
Communications: electrical
Condition responsive indicating system
Specific condition
C340S514000, C340S572100, C340S572800, C340S584000, C340S588000, C340S589000, C340S655000, C340S010100, C324S500000, C324S512000, C235S385000, C235S492000, C374S009000, C374S010000, C374S011000, C374S120000, C374S121000, C714S025000, C714S032000
Reexamination Certificate
active
11283839
ABSTRACT:
A tag testing device uses an infrared camera to take an image of a plurality of radio frequency identification tags, compares the image with a stored standard tag pattern image storage, and detects defective tags based on the comparison. A radio wave transceiver bulk reads the tags using anti-collision, a tag response counter counts a number of tag responses, and a defective tag detector compares a number of heat emitting tags based upon the image processing with a number of tag responses counted by the tag response counter. If the number of heat emitting tags does not match a number of responsive tags, a number of the tags tested are changed by partially shielding the tags and the radio wave transceiver repeatedly bulk reads the tags using the anti-collision function while a shielding range is gradually changed, thereby narrowing down other possible defective but heat emitting tags.
REFERENCES:
patent: 5983363 (1999-11-01), Tuttle et al.
patent: 6104291 (2000-08-01), Beauvillier et al.
patent: 6111424 (2000-08-01), Bosacchi
patent: 6512458 (2003-01-01), Kobayashi et al.
patent: 6593853 (2003-07-01), Barrett et al.
patent: 6657447 (2003-12-01), Parandoosh
patent: 6840666 (2005-01-01), Enachescu et al.
patent: 7151442 (2006-12-01), Nguyen
patent: 7154283 (2006-12-01), Weakley et al.
patent: 7164353 (2007-01-01), Puleston et al.
patent: 7225992 (2007-06-01), Forster
patent: 11-307822 (1999-11-01), None
patent: 2003-67676 (2003-03-01), None
Bugg George A
Fujitsu Frontech Limited
Fujitsu Limited
Pham Lam P
Staas & Halsey , LLP
LandOfFree
Tag testing device, tag testing method, and tag testing program does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Tag testing device, tag testing method, and tag testing program, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Tag testing device, tag testing method, and tag testing program will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3912149