Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2007-09-11
2007-09-11
Raevis, Robert (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
Reexamination Certificate
active
10288877
ABSTRACT:
An apparatus for simulating a tactile interface with the relative position of the probe of a cantilever-based force measurement instrument, such as an atomic force microscope, molecular force probe or profilometer, or the force between the probe and a sample. The device can be easily incorporated into existing control electronics for such instruments or can be incorporated into a relatively small and simple hand-held device to be used with such instruments.
REFERENCES:
patent: 5802353 (1998-09-01), Avila et al.
patent: 6452174 (2002-09-01), Hirose et al.
Guthold, M., et al., “Controlled Manipulation of Molecular Samples with the nanoManipulator”,IEEE Transactions on Mechatronics, 2000, vol. 5, pp. 189-198.
Sitti, Metin, et al., “Tele-Nanorobotics Using Atomic Force Microscope”,Proc. of IEEE/RSJ IROS '98 Conference, Oct. 1998, pp. 1739-1746.
Sitti, Metin, et al., “Teleoperated Nano Scale Object Manipulation”, article forRecent Advances on Mechatronics, Springer Verlag Pub., May 1999.
Sitti, Metin, et al., “Teleoperated Touch Feedback from the Surfaces at the Nanoscale: Modelling and Experiments”,IEEE/ASME Transactions on Mechatronics, Mar. 2003, vol. 8, No. 1, pp. 1-12.
Bocek Dan
Cleveland Jason
Day Todd
Proksch Roger
Asylum Research Corporation
Morgan & Lewis & Bockius, LLP
Raevis Robert
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