Optics: measuring and testing – Of light reflection
Reexamination Certificate
2006-09-05
2006-09-05
Stafira, Michael P. (Department: 2877)
Optics: measuring and testing
Of light reflection
C356S300000, C356S310000, C436S034000, C436S043000, C436S501000
Reexamination Certificate
active
07102752
ABSTRACT:
An analyzer useful in determining the presence of an analyte using a diffraction based sensing device and methods and systems using this device. The present invention may be used with a variety of different diffraction-based diagnostic methods and systems. The analyzer enhances the accuracy and/or usefulness of these devices in detecting analytes, while providing more ease-of-use and convenience to the user. The analyzer may include a light source, a photodiode, a microprocessor and a display system for informing the user of the result. Other features include mirrors, lenses, a sample holder, and a mask for blocking out some light. The analyzer and related method and system may be used in a large number of environments, including commercial, professional, and individual.
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Abstract of Japanese Patent
Atanassov Zdravko Savov
Kaylor Rosann Marie
Knotts Michael Eugene
Yang Difei
Dority & Manning P.A.
Kimberly--Clark Worldwide, Inc.
Stafira Michael P.
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