Systems, methods and apparatus to offset correction of X-ray...

Details Systems, methods and apparatus to offset correction of X-ray... Systems, methods and apparatus to offset correction of X-ray...

2007-05-15

2007-05-15

Yun, Jurie (Department: 2882)

X-ray or gamma ray systems or devices

Electronic circuit

With display or signaling

C378S098700, C378S207000, C382S132000

Reexamination Certificate

active

11165775

ABSTRACT:
Systems and methods are provided for offset correction of images from a flat panel detector. In some embodiments, the apparatus and method develops one or more offset maps, acquired during system idle, for the imaging system at a plurality of exposure windows. In some embodiments, exposure parameters acquired for the imaging system before image acquisition are used to select an offset map to subtract from subsequent X-ray images. In some further embodiments, executable instructions are disclosed for directing a processor to compile one or more offset map and exposure parameters to subtract based on a selected offset map noise elements from X-ray images and thereby minimizing the time between image acquisition and display of processed images.

REFERENCES:
patent: 5400384 (1995-03-01), Fernandes et al.
patent: 6353654 (2002-03-01), Granfors et al.
patent: 6798864 (2004-09-01), Petrick et al.
patent: 7003146 (2006-02-01), Eck et al.

Affiliated with

Also associated with

Rating

Systems, methods and apparatus to offset correction of X-ray... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Systems, methods and apparatus to offset correction of X-ray..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Systems, methods and apparatus to offset correction of X-ray... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3805432